TEST SUMMARY INFORMATION
Part #: 3C-2189-AAManufacturer: Galileo Technology (Marvel Technology Group)
Category/Sub: Communication/Controller
Package: 24-pin PDIP
Lot Size: 10 Pieces
Description: Monolithic Communications Controller Chip
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| Figure 1. Three defects in this lot - which ones are they? |
Tests Performed:
- Visual Inspection
- Marking Permanency
- Surface Test
- Electrical Test
- X-Ray Test
- XRF Test
Results:
The lot consists of two date codes: 8752 (three pieces) and 9707 (seven pieces). All parts passed visual inspection, marking permanency and surface tests, but the electrical test yielded 3 failures that were subsequently confirmed by X-Ray failure analysis. Two of the devices that failed electrical testing had a much smaller die size and different leadframe than the others, as well as a known good die.
The lot consists of two date codes: 8752 (three pieces) and 9707 (seven pieces). All parts passed visual inspection, marking permanency and surface tests, but the electrical test yielded 3 failures that were subsequently confirmed by X-Ray failure analysis. Two of the devices that failed electrical testing had a much smaller die size and different leadframe than the others, as well as a known good die.
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| Figure 2.) Failed Part With Smaller Die and Different Leadframe, (Also, note difference in bond wire pattern with an acceptable device, in Figure 3, below.) |
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| Figure 3.) X-Ray of Known Good Device |
The other failed devices exhibited a different bond wire pattern than the rest - notice the crossed wires in the center on the right side of the die.
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| Firgure 4.) Non-functional Device with Crossed Bond Wires.
Conclusion
The failed electrical devices were analyzed using X-Ray technology which confirmed various inconsistencies with similar X-Rays of a Known Good Device. The substandard parts were quarantined pending proper disposal.
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